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Best Sellers | | Home Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology) | |
|  | |  | | | Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology) | | | | | | | |
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| | Description | The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections. | |
| | Product Details | | Author: | R.F. Egerton | | Hardcover: | 500 pages | | Publisher: | Springer | | Publication Date: | May 31, 1996 | | Language: | English | | ISBN: | 0306452235 | | Product Length: | 9.46 inches | | Product Width: | 6.36 inches | | Product Height: | 1.29 inches | | Product Weight: | 1.84 pounds | | Package Length: | 9.29 inches | | Package Width: | 6.06 inches | | Package Height: | 0.87 inches | | Package Weight: | 1.9 pounds | | Average Customer Rating: |  based on 1 reviews |
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4 of 4 found the following review helpful:
A comprehensive overview of EELS in TEM Oct 08, 2010
By Ulfilas
For as long as I can remember, Ray Egerton has been at the forefront of electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM). For those who want to find out more about EELS and its ability to map composition at a nanometer scale (especially for low Z elements), this book is probably the best place to start. In addition to describing such instrumentation as magnetic prisms and lenses, the author provides a review of elastic and inelastic scattering theory. Inelastic scattering, as the key to understanding EELS, and the source of the features in the EELS spectrum, is broken down into plasmons (both bulk and surface) and the characteristic atomic excitations that lead to absorption edges. Bethe's theory of energy loss from characteristic atomic excitations is laid out in sufficient detail, as is the formulation of EELS spectra in terms of the complex dielectric constant. Inelastic scattering theory is, in turn, used by the author to calculate the spatial resolution of this technique as a function of the incident electron energy and the electron energy loss.
If you want to get a taste of what this book is like, I would suggest that you read Egerton's review article in Rep. Prog. Phys. 72 (2009) 016502 as well as his article in Ultramicroscopy 4 (1979) 169.
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